Jinsu Jeong

Systematic DC/AC Performance Benchmarking of Sub-7-nm Node FinFETs and Nanosheet FETs

Jun-Sik Yoon, Jinsu Jeong, Seunghwan Lee et al. · IEEE Journal of the Electron Devices Society · 2018 · 86 citations · Full text

Device Modeling, Electrical Engineering, Engineering +15

Multi-${V}_{\text{th}}$ Strategies of 7-nm node Nanosheet FETs With Limited Nanosheet Spacing

Jun-Sik Yoon, Jinsu Jeong, Seunghwan Lee et al. · IEEE Journal of the Electron Devices Society · 2018 · 68 citations · Full text

Nanosheet, Engineering, Narrow Ns Spacing +21

Comprehensive Analysis of Source and Drain Recess Depth Variations on Silicon Nanosheet FETs for Sub 5-nm Node SoC Application

Jinsu Jeong, Jun-Sik Yoon, Seunghwan Lee et al. · IEEE Access · 2020 · 42 citations · Full text

Device Modeling, Semiconductor Technology, Electrical Engineering +14

Reduction of Process Variations for Sub-5-nm Node Fin and Nanosheet FETs Using Novel Process Scheme

Jun-Sik Yoon, Seunghwan Lee, Junjong Lee et al. · IEEE Transactions on Electron Devices · 2020 · 41 citations

Materials Science, Device Modeling, Chemical Engineering +15

Bottom Oxide Bulk FinFETs Without Punch-Through-Stopper for Extending Toward 5-nm Node

Jun-Sik Yoon, Jinsu Jeong, Seunghwan Lee et al. · IEEE Access · 2019 · 36 citations · Full text

Materials Science, Electrical Engineering, Engineering +11