S.M.M. Coelho

A compact streak camera for 150 fs time resolved measurement of bright pulses in ultrafast electron diffraction

Günther Kassier, K. Haupt, Nicolas Erasmus et al. · Review of Scientific Instruments · 2010 · 63 citations

Natural Sciences, Physics, Atomic Physics +9

The influence of high energy electron irradiation on the Schottky barrier height and the Richardson constant of Ni/4H-SiC Schottky diodes

E. Omotoso, W.E. Meyer, F.D. Auret et al. · Materials Science in Semiconductor Processing · 2015 · 59 citations

Engineering, Electrical Engineering, Materials Science +17

Electrical characterization of defects introduced during electron beam deposition of Pd Schottky contacts on n-type Ge

F.D. Auret, W.E. Meyer, S.M.M. Coelho et al. · Applied Physics Letters · 2006 · 42 citations

Natural Sciences, Materials Science, Physics +17

Effects of hydrogen, oxygen, and argon annealing on the electrical properties of ZnO and ZnO devices studied by current-voltage, deep level transient spectroscopy, and Laplace DLTS

W. Mtangi, F.D. Auret, W.E. Meyer et al. · Journal of Applied Physics · 2012 · 35 citations

Engineering, Materials Engineering, Materials Science +16

Long range annealing of defects in germanium by low energy plasma ions

Juan F. R. Archilla, S.M.M. Coelho, F.D. Auret et al. · Physica D Nonlinear Phenomena · 2015 · 35 citations · Full text

Natural Sciences, Materials Science, Physics +12