Samuel S. So

Characterization of real surfaces by ellipsometry

K. Vedam, Samuel S. So · Surface Science · 1972 · 60 citations

Natural Sciences, Materials Science, Mathematics +12

Generalized Ellipsometric Method for the Absorbing Substrate Covered with a Transparent-Film System Optical Constants of Silicon at 3655 Å*

Samuel S. So, K. Vedam · Journal of the Optical Society of America · 1972 · 47 citations

Natural Sciences, Materials Science, Physics +17

Ellipsometric analyses for an absorbing surface film on an absorbing substrate with or without an intermediate surface layer

Samuel S. So · Surface Science · 1976 · 29 citations

Natural Sciences, Materials Engineering, Materials Science +15

Optical Constants of Silicon at 5461 Å*

Samuel S. So, K. Vedam · Journal of the Optical Society of America · 1972 · 11 citations

Natural Sciences, Materials Science, Physics +14