D.J. Fitzgerald - Concepedia

Author

D.J. Fitzgerald

Also Known As

D Fitzgerald, D. FITZGERALD, D. Fitzgerald, D. J. Fitzgerald, D.J. Fitzgerald, DENNIS J. FITZGERALD, Dennis Fitzgerald, Dennis J. Fitzgerald

Publications

1.4K

Citations

H-Index

Concepts

All Affiliations

Fairchild Semiconductor (United States)Jet Propulsion Laboratory

About

D.J. Fitzgerald is an author at Fairchild Semiconductor (United States) specializing in engineering, physics, and applied physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	13	15	1.3K
2	Applied Physics	11	11	1.2K
3	Electrical Engineering	10	11	606
4	Chemical Engineering	2	2	66
5	Chemistry	1	1	15

D.J. Fitzgerald

Publications

1.3K

Citations

H-Index

Page 1

	Year	Citations
Surface effects on p-n junctions: Characteristics of surface space-charge regions under non-equilibrium conditions Andrew S. Grove, D.J. Fitzgerald Solid-State Electronics Surface EffectsEngineeringPhysicsNanoelectronicsSurface Science	1966	434
Effects of ionizing radiation on oxidized silicon surfaces and planar devices E. H. Snow, Andrew S. Grove, D.J. Fitzgerald Proceedings of the IEEE Electrical EngineeringUltraviolet RadiationPlanar DevicesLow Energy ElectronPhysics	1967	314
Surface recombination in semiconductors D.J. Fitzgerald, Andrew S. Grove Surface Science SemiconductorsEngineeringPhysicsSurface ScienceApplied Physics	1968	218
SURFACE-STATE RELATED <i>l/f</i> NOISE IN <i>p-n</i> JUNCTIONS AND MOS TRANSISTORS S.T. Hsu, D.J. Fitzgerald, Andrew S. Grove Applied Physics Letters SemiconductorsL/f NoiseElectrical EngineeringSemiconductor TechnologyEngineering	1968	82
The kinetics of coal carbonization in the plastic state D.J. Fitzgerald Transactions of the Faraday Society Materials ScienceChemical EngineeringCarbon SequestrationElectrical EngineeringEngineering	1956	51
The origin of channel currents associated with P<sup>+</sup>regions in silicon Andrew S. Grove, D.J. Fitzgerald IEEE Transactions on Electron Devices Electrical EngineeringAvalanche MechanismEngineeringPhysicsLarge Channel Currents	1965	48
Radiation-induced increase in surface recombination velocity of thermally oxidized silicon structures D.J. Fitzgerald Proceedings of the IEEE Radiation-induced IncreaseEngineeringPhysicsSurface ScienceApplied Physics	1966	39
Effects of an Internally-Mounted Cathode on Hall Thruster Plume Properties Richard R. Hofer, Lee Johnson, Dan M. Goebel, Electrical EngineeringEngineeringHall ThrusterAerospace EngineeringRocket Engine	2006	24
Experimentally Determined Neutral Density and Plasma Parameters in a 30 CM Ion Engine Anita Sengupta, Dan M. Goebel, George Tynan, 40th AIAA/ASME/SAE/ASEE Joint Propulsion Conference and Exhibit Electron DensityElectrical EngineeringPlasma ParametersEngineeringElectron Density Range	2004	21
Band-to-band tunneling and thermal generation gate-induced drain leakage Steven H. Voldman, J.A. Brachitta, D.J. Fitzgerald IEEE Transactions on Electron Devices Non-volatile MemoryElectrical EngineeringEngineeringPhysicsMosfet Dielectric Scaling	1988	18

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