Statistics
Publications
2
Citations
44
H-Index
2
Active since
2010
Sam Burns is an author at STMicroelectronics (France) specializing in absorbed dose, radiation effects on reliability, and radiation-hard electronics.
Publications per year
2010–2011
2
2
The Effects of ELDRS at Ultra-Low Dose Rates
Dakai Chen, James Forney, R.L. Pease et al. · 2010 · 24 citations · Full text
Enhanced Low Dose Rate Sensitivity at Ultra-Low Dose Rates
Dakai Chen, R.L. Pease, Kirby Kruckmeyer et al. · IEEE Transactions on Nuclear Science · 2011 · 20 citations · Full text
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