Tomasz Fok

An investigation by electron spectroscopy for chemical analysis of chemical treatments of the (100) surface of n-type InP epitaxial layers for Langmuir film deposition

David Clark, Tomasz Fok, G.G. Roberts et al. · Thin Solid Films · 1980 · 144 citations

Materials Science, Surface Characterization, Chemical Engineering +10

Water-window microscopy using a compact, laser-plasma SXR source based on a double-stream gas-puff target

P. Wachulak, Andrzej Bartnik, Marcin Skorupka et al. · Applied Physics B · 2013 · 39 citations · Full text

Sub 1-μm resolution “water-window” microscopy using a compact, laser-plasma SXR source based on a double stream gas-puff target

P. Wachulak, Andrzej Bartnik, Łukasz Węgrzyński et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2013 · 28 citations

Water-window ” Microscopy, High Resolution, Microscopy +6

Photoionized plasmas induced in neon with extreme ultraviolet and soft X-ray pulses produced using low and high energy laser systems

Andrzej Bartnik, P. Wachulak, Tomasz Fok et al. · Physics of Plasmas · 2015 · 25 citations

Engineering, Electron Density Measurements, Laser-plasma Interaction +19

Surface modification of InP by plasma techniques using hydrogen and oxygen

David Clark, Tomasz Fok · Thin Solid Films · 1981 · 22 citations

Materials Science, Chemical Engineering, Engineering +9