Joel I. Haberman

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Active since

1983

Affiliations

Joel I. Haberman is an author at ExxonMobil (United States) specializing in materials science, semiconductor device materials, and semiconductor devices.

Publications per year

1983–1984

Publications

An rf bridge technique for contactless measurement of the carrier lifetime in silicon wafers

T. Tiedje, Joel I. Haberman, R. W. Francis et al. · Journal of Applied Physics · 1983 · 38 citations

Engineering, Electrical Engineering, Materials Science +17

Effects of interfacial charge on the electron affinity, work function, and electrical characteristics of thinly oxidized semiconductor-insulator-semiconductor and metal-insulator-semiconductor devices

Amal K. Ghosh, Tom Feng, Joel I. Haberman et al. · Journal of Applied Physics · 1984 · 21 citations

Engineering, Electrical Engineering, Materials Science +17

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