D. W. Ormond

Dielectric Breakdown in Silicon Dioxide Films on Silicon

C. M. Osburn, D. W. Ormond · Journal of The Electrochemical Society · 1972 · 161 citations

Engineering, Electrical Engineering, Materials Science +17

Dielectric Breakdown in Silicon Dioxide Films on Silicon

C. M. Osburn, D. W. Ormond · Journal of The Electrochemical Society · 1972 · 106 citations

Engineering, Electrical Engineering, Materials Science +17

Properties of Al2 O 3 Films Deposited from the AlCl3,  CO 2, and  H 2 System

V. J. Silvestri, C. M. Osburn, D. W. Ormond · Journal of The Electrochemical Society · 1978 · 40 citations

Natural Sciences, Materials Engineering, Materials Science +17

Use of electron-trapping region to reduce leakage currents and improve breakdown characteristics of MOS structures

D. J. DiMaria, Donald R. Young, D. W. Ormond · Applied Physics Letters · 1977 · 40 citations

Engineering, Electrical Engineering, Materials Science +17

Sodium-Induced Barrier-Height Lowering and Dielectric Breakdown on SiO[sub 2] Films on Silicon

C. M. Osburn, D. W. Ormond · Journal of The Electrochemical Society · 1974 · 36 citations

Natural Sciences, Materials Engineering, Materials Science +14