Colin L. Battersby

Effects of wet etch processing on laser-induced damage of fused silica surfaces

Colin L. Battersby, Lynn M. Sheehan, Mark R. Kozlowski · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1999 · 32 citations

Materials Science, Laser Damage Performance, Optical Materials +15

Luminescence investigation of SiO 2 surfaces damaged by 0.35-nm laser illumination

Mark R. Kozlowski, Colin L. Battersby, Stavros G. Demos · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2000 · 17 citations

Optical Materials, Engineering, Laser Material +23

Investigation of fluorescence microscopy as a tool for noninvasive detection and imaging of damage precursors at 351 nm

Stavros G. Demos, Mike C. Nostrand, Michael C. Staggs et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2002 · 11 citations · Full text

Engineering, Microscopy, Laser Applications +25

Automated damage test facilities for materials development and production optic quality assurance at Lawrence Livermore National Laboratory

Lynn M. Sheehan, Sheldon Schwartz, Colin L. Battersby et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 1999 · 10 citations · Full text

Engineering, Measurement, Optical Testing +19