M. Mack - Concepedia

Author

M. Mack

IBM Research - Thomas J. Watson Research Center

Also Known As

M Mack, M. H. Mack, M. Mack, M.H. Mack

Publications

197

Citations

H-Index

Concepts

All Affiliations

IBM Research - Thomas J. Watson Research Center IBM (United States)Philips (United States)

About

M. Mack is an author at IBM Research - Thomas J. Watson Research Center specializing in engineering, instrumentation, and health sciences.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	8	8	134
2	Health Sciences	5	5	108
3	Education	3	3	58
4	Applied Physics	3	3	37
5	Computer Engineering	2	2	32

M. Mack

Publications

166

Citations

H-Index

Page 1

	Year	Citations
Statistical factors in X-ray intensity measurements M. Mack, N. Spielberg Spectrochimica Acta X-ray SpectroscopyRadiographyStatistical FactorsMeasurementEducation	1958	32
Seemann–Bohlin X-ray diffractometry. I. Instrumentation W. Parrish, M. Mack Acta Crystallographica X-ray SpectroscopyHealth SciencesEngineeringMicroscopyX-ray Diffraction	1967	28
Seemann–Bohlin X-ray diffractometry. II. Comparison of aberrations and intensity with conventional diffractometer M. Mack, W. Parrish Acta Crystallographica X-ray SpectroscopyHealth SciencesOphthalmologyMicroscopyOptical Properties	1967	27
Evaluation of truncation methods for accurate centroid lattice parameter determination J. Taylor, M. Mack, W. Parrish Acta Crystallographica Truncation MethodsEngineeringRadiation DetectionMeasurementCalibration	1964	16
Semiconductor Analysis Using Finite Elements—Part II: IGFET and BJT Case Studies Gary D. Hachtel, M. Mack, R. R. O’Brien IBM Journal of Research and Development Numerical AnalysisEngineeringFinite ElementsSemiconductor MaterialsSemiconductor Device	1981	16
Semiconductor Analysis Using Finite Elements—Part I: Computational Aspects Gary D. Hachtel, M. Mack, R. R. O’Brien, IBM Journal of Research and Development Numerical AnalysisEngineeringComputational MechanicsComputer ImplementationSemiconductors	1981	16
Determination of apertures in the focusing plane of X-ray powder diffractometers W. Parrish, M. Mack, J. Taylor Journal of Scientific Instruments EngineeringMicroscopySlit WidthsPolycapillary OpticsX-ray Imaging	1966	11
Dispersion, Lorentz and polarization in the centroid method of precision lattice parameter determination J. Ladell, M. Mack, W. Parrish, Acta Crystallographica Numerical AnalysisPrecision MeasurementEngineeringPhysicsMeasurement	1959	10
Dependence of Lattice Parameters on Various Angular Measures of Diffractometer Line Profiles<sup>*</sup> W. Parrish, J. Taylor, M. Mack Advances in X-ray Analysis X-ray SpectroscopyEngineeringMeasurementOptical TestingX-ray Imaging	1963	10

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