Concepedia

M. Mack

MM

Statistics

Publications

9

Citations

166

H-Index

9

Active since

1958

Affiliations

IBM Research - Thomas J. Watson Research Center(Current)

IBM (United States)

Philips (United States)

M. Mack is an author at IBM Research - Thomas J. Watson Research Center specializing in engineering, instrumentation, and health sciences.

Top concepts

Publications per year

1958–1981

9

Publications

9

Statistical factors in X-ray intensity measurements

M. Mack, N. Spielberg · Spectrochimica Acta · 1958 · 32 citations

, , +7

Seemann–Bohlin X-ray diffractometry. I. Instrumentation

W. Parrish, M. Mack · Acta Crystallographica · 1967 · 28 citations

, , +6

Seemann–Bohlin X-ray diffractometry. II. Comparison of aberrations and intensity with conventional diffractometer

M. Mack, W. Parrish · Acta Crystallographica · 1967 · 27 citations

, , +11

Evaluation of truncation methods for accurate centroid lattice parameter determination

J. Taylor, M. Mack, W. Parrish · Acta Crystallographica · 1964 · 16 citations

, , +9

Semiconductor Analysis Using Finite Elements—Part II: IGFET and BJT Case Studies

Gary D. Hachtel, M. Mack, R. R. O’Brien · IBM Journal of Research and Development · 1981 · 16 citations

, , +19

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