Hiroyoshi Soezima

Construction of a Soft X-Ray Emission Spectroscopy (SXES) Apparatus and Its Application for Study of Electronic and Atomic Structures of a Multilayer System

Motohiro Iwami, Masaaki Hirai, M. Kusaka et al. · Japanese Journal of Applied Physics · 1990 · 44 citations

Natural Sciences, Materials Science, Physics +15

Simultaneous angle-resolved measurement of the band structure of single-crystal graphite by an improved two-dimensional display analyzer

Hiroyuki Nishimoto, Hiroshi Daimon, S. Suga et al. · Review of Scientific Instruments · 1993 · 37 citations

Natural Sciences, Materials Engineering, Materials Science +13

Solid surface observation at very low accelerating voltage (200V–1kV) by scanning electron microscope

Hiroyoshi Soezima · Surface Science · 1979 · 13 citations

Natural Sciences, Materials Science, Physics +12

Nondestructive Depth Profiling Using Soft X-Ray Emission Spectroscopy by Incident Angle Variation Method

Shoichi Yamauchi, Masaaki Hirai, M. Kusaka et al. · Japanese Journal of Applied Physics · 1992 · 13 citations

Natural Sciences, Materials Engineering, Materials Science +13

Electron probe micro analysis.

Hiroyoshi Soezima · Hyomen Kagaku · 1989 · 13 citations · Full text

Engineering, Electrical Engineering, Electromagnetics +2