Statistics
Publications
4
Citations
93
H-Index
4
Active since
2014
Affiliations
Thomas Kemen is an author at Carl Zeiss (Germany) specializing in engineering, electron microscopy, and defect inspection.
Publications per year
2014–2015
4
4
Matt Malloy, B. L. Thiel, Benjamin Bunday et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2015 · 23 citations
1–4 of 4