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Publications
1
Citations
14
H-Index
Active since
2001
R. Kumpe is an author specializing in nanomaterials, surface microscopy, and surface metrology.
Publications per year
2001–2001
Techniques for analysing nanotopography on polished silicon wafers
Timo Müller, R. Kumpe, H.A. Gerber et al. · Microelectronic Engineering · 2001 · 14 citations
Natural Sciences, Materials Engineering, Materials Science +12
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