H. Liebl

Ion Microprobe Mass Analyzer

H. Liebl · Journal of Applied Physics · 1967 · 338 citations

Microscopy, Analytical Microsystems, Ion Beam Instrumentation +20

Novel charged particle analyzer for momentum determination in the multichanneling mode: I. Design aspects and electron/ion optical properties

H. Engelhardt, W. Bäck, D. Menzel et al. · Review of Scientific Instruments · 1981 · 132 citations

Microscopy, Multichanneling Mode, Electron Optic +16

High-performance GaAs polarized electron source for use in inverse photoemission spectroscopy

U. Kolac, M. Donath, K. Ertl et al. · Review of Scientific Instruments · 1988 · 103 citations

Engineering, High-power Lasers, Electron Optic +17

Secondary−ion mass spectrometry and its use in depth profiling

H. Liebl · Journal of Vacuum Science and Technology · 1975 · 99 citations

Biological Mass Spectrometry, Chemistry, Spectrochemical Analysis +16

Sputtering Ion Source for Solids

H. Liebl, Richard F. Herzog · Journal of Applied Physics · 1963 · 96 citations

Good Mass Spectra, Engineering, Atomic Emission Spectroscopy +17