Mark E. Mason

Temperature dependence of the radiation induced change of depletion voltage in silicon PIN detectors

H. J. Ziock, K. Holzscheiter, A.N. Morgan et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 1994 · 89 citations

Electrical Engineering, Depletion Voltage, Radiation Detection +11

A shallow trench isolation study for 0.25/0.18 μm CMOS technologies and beyond

Amitava Chatterjee, J. Esquivel, Soumya Shubhra Nag et al. · 2002 · 28 citations

Low-power Electronics, Electrical Engineering, Engineering +13

Integration of unit processes in a shallow trench isolation module for a 0.25 μm complementary metal–oxide semiconductor technology

Amitava Chatterjee, Inayat Ali, K. Joyner et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1997 · 27 citations

Unit Processes, Electrical Engineering, Engineering +11

Hybrid Factory: The Japanese Production System in the United States

Allan Bird, Tetsuo Abo, Masahiko Aoki et al. · Academy of Management Review · 1996 · 16 citations

Business Culture, Education, Industrial Organization +24

Characterization of structure and morphology of an advanced p-channel field effect transistor under uniaxial stress by synchrotron x-ray diffraction

Ashesh Parikh, Willie J. Yarbrough, Mark E. Mason et al. · Applied Physics Letters · 2007 · 14 citations

Semiconductor Technology, Electrical Engineering, Engineering +12