Online Junction Temperature Measurement for SiC MOSFET Based on Dynamic Threshold Voltage Extraction

Xi Jiang, Jun Wang, Hengyu Yu, +4

IEEE Transactions on Power Electronics

Sic MosfetElectrical EngineeringSemiconductor DeviceEngineeringHigh Voltage Engineering +11

Numerical Study of SiC MOSFET With Integrated n-/n-Type Poly-Si/SiC Heterojunction Freewheeling Diode

Hengyu Yu, Shiwei Liang, Hangzhi Liu, +2

IEEE Transactions on Electron Devices

Sic MosfetNumerical StudyElectrical EngineeringEngineeringPower Device +8

Investigation on Degradation of SiC MOSFET Under Accelerated Stress in a PFC Converter

Xi Jiang, Jun Wang, Jianjun Chen, +3

IEEE Journal of Emerging and Selected Topics in Power Electronics

Sic MosfetElectrical EngineeringEngineeringPower DeviceBias Temperature Instability +9

A Novel Real-Time Junction Temperature Monitoring Circuit for SiC MOSFET

Hengyu Yu, Xi Jiang, Jianjun Chen, +2

Sic MosfetElectrical EngineeringEngineeringHigh Voltage EngineeringSic Mosfet Extraction +11

Comparative Study of Temperature Sensitive Electrical Parameters for Junction Temperature Monitoring in SiC MOSFET and Si IGBT

Hengyu Yu, Xi Jiang, Jianjun Chen, +2

Sic MosfetElectrical EngineeringSemiconductor DeviceEngineeringHigh Voltage Engineering +12

Modeling Irradiation-Induced Degradation for 4H-SiC Power MOSFETs

Shiwei Liang, Yu Yang, Lei Shu, +8

IEEE Transactions on Electron Devices

Device ModelingGamma-ray IrradiationElectrical EngineeringSemiconductor DeviceEngineering +13

A Novel 4H-SiC JBS-Integrated MOSFET With Self-Pinching Structure for Improved Short-Circuit Capability

Hengyu Yu, Jun Wang, Gaoqiang Deng, +3

IEEE Transactions on Electron Devices

Device ModelingSic MosfetElectrical EngineeringSemiconductor TechnologyEngineering +12

Comparative evaluation of surge current capability of the body diode of SiC JMOS, SiC DMOS, and SiC Schottky barrier diode

Xi Jiang, Jiajun Yu, Jianjun Chen, +4

Sic JmosSic MosfetElectrical EngineeringBody DiodeEngineering +9

Investigation on gate oxide reliability under gate bias screening for commercial SiC planar and trench MOSFETs

Limeng Shi, Jiashu Qian, Michael Jin, +5

Materials Science in Semiconductor Processing

Investigation on Effects of Thermal Stress on SiC MOSFET Degradation through Power Cycling Tests

Jianjun Chen, Xi Jiang, Zongjian Li, +3

Sic Mosfet DegradationPower Cycling TestsElectrical EngineeringThermal StressEngineering +13