C.W. Starke

Bounds and analysis of aliasing errors in linear feedback shift registers

T.W. Williams, Wilfried Daehn, M. Gruetzner et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1988 · 106 citations

Computing, Computer Engineering, Computer Science +12

Aliasing Errors in Signature in Analysis Registers

T.W. Williams, Wilfried Daehn, M. Gruetzner et al. · IEEE Design & Test of Computers · 1987 · 93 citations

Computing, Computer Engineering, Computer Science +10

Built-in test for CMOS circuits

C.W. Starke · International Test Conference · 1984 · 62 citations

Engineering, Computer Engineering, Electrical Engineering +11

Design for testability and diagnosis in a VLSI CMOS System/370 processor

C.W. Starke · IBM Journal of Research and Development · 1990 · 11 citations

Engineering, Computer Engineering, Electrical Engineering +17