Thomas Duden

Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit

C. Kisielowski, Bert Freitag, Maarten Bischoff et al. · Microscopy and Microanalysis · 2008 · 301 citations

Engineering, Microscopy, Three Dimensions +20

A compact electron-spin-polarization manipulator

Thomas Duden, E. Bauer · Review of Scientific Instruments · 1995 · 81 citations

Magnetism, Spintronics, Spin Dynamic +14

Magnetization Wrinkle in Thin Ferromagnetic Films

Thomas Duden, E. Bauer · Physical Review Letters · 1996 · 56 citations

Engineering, Wrinkled Magnetization, Magnetic Resonance +17

Characterisation of a CMOS active pixel sensor for use in the TEAM microscope

M. Battaglia, Devis Contarato, P. Denes et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 2010 · 50 citations · Full text

Team Microscope, Engineering, Microscope Image Processing +9

A new surface microscope for magnetic imaging

K. Grzelakowski, Thomas Duden, E. Bauer et al. · IEEE Transactions on Magnetics · 1994 · 49 citations

Magnetic Properties, Engineering, Low-dimensional Magnetism +24