Igor Krylov

Statistics

Publications

Citations

427

H-Index

Active since

1999

Affiliations

Technion – Israel Institute of Technology(Current)

Tower Semiconductor (Israel)

Consejo Nacional de Investigaciones Científicas y Técnicas

Stanford University

National Technological University

Igor Krylov is an author at Technion – Israel Institute of Technology specializing in materials science, materials engineering, and electronic materials.

ORCID

Publications per year

1999–2021

Publications

Ferroelectricity of as-deposited HZO fabricated by plasma-enhanced atomic layer deposition at 300 °C by inserting TiO2 interlayers

Yuanshen Qi, Xianbin Xu, Igor Krylov et al. · Applied Physics Letters · 2021 · 47 citations

Natural Sciences, Materials Engineering, Materials Science +17

Experimental evidence for the correlation between the weak inversion hump and near midgap states in dielectric/InGaAs interfaces

Igor Krylov, Lior Kornblum, A. Gavrilov et al. · Applied Physics Letters · 2012 · 45 citations

Engineering, Materials Engineering, Materials Science +17

The physical origin of dispersion in accumulation in InGaAs based metal oxide semiconductor gate stacks

Igor Krylov, D. Ritter, M. Eizenberg · Journal of Applied Physics · 2015 · 41 citations

Natural Sciences, Materials Science, Physics +17

Indium outdiffusion and leakage degradation in metal/Al2O3/In0.53Ga0.47As capacitors

Igor Krylov, A. Gavrilov, M. Eizenberg et al. · Applied Physics Letters · 2013 · 31 citations

Engineering, Materials Engineering, Materials Science +16

Correlation between Ga-O signature and midgap states at the Al2O3/In0.53Ga0.47As interface

Igor Krylov, A. Gavrilov, M. Eizenberg et al. · Applied Physics Letters · 2012 · 31 citations

Engineering, Materials Engineering, Materials Science +17

1–5 of 21