S. Kämmer

Scanning near-field optical microscope with a laser diode and nanometer-sized bit recording

S. Hosaka, T. Shintani, M. Miyamoto et al. · Thin Solid Films · 1996 · 34 citations

Engineering, Electrical Engineering, Physics +13

Latent image formation: Nanoscale topography and calorimetric measurements in chemically amplified resists

Leonidas E. Ocola, David S. Fryer, Paul F. Nealey et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1996 · 22 citations

Natural Sciences, Materials Engineering, Materials Science +12

Detecting electrical forces in noncontact atomic force microscopy

F. Müller, A-D Müller, Michael Hietschold et al. · Measurement Science and Technology · 1998 · 22 citations

Natural Sciences, Materials Engineering, Materials Science +17

Applications of scanning electrical force microscopy

F. Müller, Anja Müller, Michael Hietschold et al. · Microelectronics Reliability · 1997 · 11 citations

Natural Sciences, Materials Engineering, Materials Science +11