Krishna Dayal Shukla

Redefining the Speed Limit of Phase Change Memory Revealed by Time-resolved Steep Threshold-Switching Dynamics of AgInSbTe Devices

Krishna Dayal Shukla, Nishant Saxena, Suresh Durai et al. · Scientific Reports · 2016 · 37 citations · Full text

Natural Sciences, Materials Science, Physics +16

Temperature dependent structural evolution and crystallization properties of thin Ge ₁₅ Te ₈₅ film revealed by <i>in situ</i> resistance, x-ray diffraction and scanning electron microscopic studies

Rathinavelu Sengottaiyan, Nishant Saxena, Krishna Dayal Shukla et al. · Journal of Physics D Applied Physics · 2019 · 15 citations

Natural Sciences, Materials Science, Physics +17

Direct Evidence for a Systematic Evolution of Optical Band Gap and Local Disorder in Ag, In Doped Sb₂Te Phase Change Material

Krishna Dayal Shukla, Smriti Sahu, Anbarasu Manivannan et al. · physica status solidi (RRL) - Rapid Research Letters · 2017 · 12 citations

Natural Sciences, Materials Science, Physics +17

An ultrafast programmable electrical tester for enabling time-resolved, sub-nanosecond switching dynamics and programming of nanoscale memory devices

Krishna Dayal Shukla, Nishant Saxena, Anbarasu Manivannan · Review of Scientific Instruments · 2017 · 10 citations

Engineering, Computer Engineering, Electrical Engineering +14