Concepedia
Statistics
Publications
1
Citations
13
H-Index
Active since
2009
Ok is an author specializing in leakage current reduction, gate oxide thickness effects, and device modeling.
Publications per year
2009–2009
Mechanisms for low on-state current of Ge (SiGe) nMOSFETs: A comparative study on gate stack, resistance, and orientation-dependent effective masses
Oh, Ok, Loh et al. · Symposium on VLSI Technology · 2009 · 13 citations
Engineering, Electrical Engineering, Materials Science +15
1–1 of 1