Temel Büyüklimanli

Characterization of sol-gel deposited niobium pentoxide films for electrochromic devices

Nilgün Özer, Timothy Barreto, Temel Büyüklimanli et al. · Solar Energy Materials and Solar Cells · 1995 · 88 citations

Natural Sciences, Materials Engineering, Materials Science +14

Hydrogen plasma enhanced crystallization of hydrogenated amorphous silicon films

K. Pangal, James C. Sturm, S. Wagner et al. · Journal of Applied Physics · 1999 · 76 citations

Natural Sciences, Materials Science, Physics +17

Accurate measurements of the intrinsic diffusivities of boron and phosphorus in silicon

Yaser M. Haddara, Brennan T. Folmer, Mark E. Law et al. · Applied Physics Letters · 2000 · 69 citations

Engineering, Materials Engineering, Materials Science +17

Suppression of boron outdiffusion in SiGe HBTs by carbon incorporation

L. Lanzerotti, J. C. Sturm, E.A. Stach et al. · 2002 · 62 citations

Engineering, Electrical Engineering, Materials Science +16

Suppression of boron transient enhanced diffusion in SiGe heterojunction bipolar transistors by carbon incorporation

L. Lanzerotti, James C. Sturm, E.A. Stach et al. · Applied Physics Letters · 1997 · 54 citations

Engineering, Electrical Engineering, Materials Science +17