Concepedia

Gary Mount

GM

Statistics

Publications

3

Citations

77

H-Index

3

Active since

1998

Affiliations

Evans Analytical Group (United States)(Current)

Gary Mount is an author at Evans Analytical Group (United States) specializing in materials science, natural sciences, and secondary ion mass spectrometry.

Publications per year

1998–2006

3

Publications

3

Sputtering rate change and surface roughening during oblique and normal incidence O2+ bombardment of silicon, with and without oxygen flooding

C. W. Magee, Gary Mount, Stephen P. Smith et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1998 · 39 citations

, , +15

Recent advances in secondary ion mass spectrometry to characterize ultralow energy ion implants

Victor K. F. Chia, Gary Mount, M. J. Edgell et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1999 · 24 citations

, , +9

Ultrashallow profiling using secondary ion mass spectrometry: Estimating junction depth error using mathematical deconvolution

Ming Hong Yang, Gary Mount, Ian Mowat · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2006 · 14 citations

, , +13

1–3 of 3