J. M. DeLucca

Analysis of a thin AlN interfacial layer in Ti/Al and Pd/Al ohmic contacts to n-type GaN

B. P. Luther, J. M. DeLucca, Suzanne E. Mohney et al. · Applied Physics Letters · 1997 · 91 citations

Materials Science, Aluminium Nitride, Electrical Engineering +14

An investigation into the early stages of oxide growth on gallium nitride

Scott D. Wolter, J. M. DeLucca, Suzanne E. Mohney et al. · Thin Solid Films · 2000 · 88 citations

Materials Science, Engineering, Early Stages +5

Titanium and aluminum-titanium ohmic contacts to p-type SiC

J. Crofton, L.M. Beyer, John R. Williams et al. · Solid-State Electronics · 1997 · 87 citations

Materials Engineering, Materials Science, Engineering +4

Sn Corrosion and Its Influence on Whisker Growth

John Osenbach, J. M. DeLucca, B. D. Potteiger et al. · IEEE Transactions on Electronics Packaging Manufacturing · 2007 · 77 citations

Materials Science, Materials Engineering, Crystal Structure +14

Sn-whiskers: truths and myths

John Osenbach, J. M. DeLucca, B. D. Potteiger et al. · Journal of Materials Science Materials in Electronics · 2006 · 54 citations

Intercellular Communication, Neuronal Network, Technology