A. V. Abramov

Determination of the metal nanometer layer thickness and semiconductor conductivity in metal-semiconductor structures from electromagnetic reflection and transmission spectra

A. V. Skripal, A. V. Abramov, A. S. Bogolyubov · Technical Physics · 2006 · 34 citations

Natural Sciences, Materials Science, Physics +17

Measurement of the metal nanometer layer parameters on dielectric substrates using photonic crystals based on the waveguide structures with controlled irregularity in the microwave band

A. V. Abramov, A. N. Bogolubov, M. K. Merdanov · 2007 European Microwave Conference · 2007 · 19 citations

Engineering, Electrical Engineering, Materials Science +13

Microstrip photonic crystals used for measuring parameters of liquids

A. V. Skripal, A. V. Abramov, A. S. Bogolyubov et al. · Technical Physics · 2010 · 14 citations

Natural Sciences, Electrical Engineering, Physics +10

Measurements of thickness of metal films in sandwich structures by the microwave reflection spectrum

A. V. Abramov, A. S. Bogolyubov · 2006 · 13 citations

Natural Sciences, Electrical Engineering, Materials Science +17