2006 · 13 citations · 1 references
Natural SciencesElectrical EngineeringMaterials ScienceMaterials CharacterizationMicrowave EngineeringThin FilmsMicrowave MaterialsMicrowave MeasurementsMicrowave SpectroscopyNanomaterial CharacterizationThin Film Electrical PropertiesThin-film MaterialsCharacterization Of Microwave MaterialsFilm Thickness MeasurementMetal Thin FilmsMetallic Sandwich StructuresMetallic Thin FilmsMicrowave MetrologySandwich StructuresWave Propagation In Sandwich Structures
The method for measurements of the thickness of nanometer metal films in sandwich structures by the microwave reflection spectrum had been proposed and implemented experimentally.
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The measurement of the properties of materials
Mohammed N. Afsar, J.R. Birch, R.N. Clarke et al. · Proceedings of the IEEE · 1986 · 354 citations