Elizabeth C. Auden

Electron-Induced Single-Event Upsets in Static Random Access Memory

M. King, Robert A. Reed, Robert A. Weller et al. · IEEE Transactions on Nuclear Science · 2013 · 73 citations

Engineering, Computer Engineering, Electrical Engineering +13

Physical Processes and Applications of the Monte Carlo Radiative Energy Deposition (MRED) Code

Robert A. Reed, Robert A. Weller, Marcus H. Mendenhall et al. · IEEE Transactions on Nuclear Science · 2015 · 72 citations

Engineering, Computer Engineering, Nuclear Engineering +17

The Impact of Delta-Rays on Single-Event Upsets in Highly Scaled SOI SRAMs

M. King, Robert A. Reed, Robert A. Weller et al. · IEEE Transactions on Nuclear Science · 2010 · 69 citations

Engineering, Computer Engineering, Electrical Engineering +17

Thermal Neutron-Induced Single-Event Upsets in Microcontrollers Containing Boron-10

Elizabeth C. Auden, Heather Quinn, S.A. Wender et al. · IEEE Transactions on Nuclear Science · 2019 · 27 citations · Full text

Engineering, Computer Engineering, Physics +10

Single Particle Displacement Damage in Silicon

Elizabeth C. Auden, Robert A. Weller, Marcus H. Mendenhall et al. · IEEE Transactions on Nuclear Science · 2012 · 26 citations

Natural Sciences, Materials Science, Physics +15