Thierry Mélin

Electric force microscopy of individually charged nanoparticles on conductors: An analytical model for quantitative charge imaging

Thierry Mélin, H. Diesinger, D. Deresmes et al. · Physical Review B · 2004 · 92 citations

Electric Force Microscopy, Engineering, Microscopy +20

Probing Nanoscale Dipole-Dipole Interactions by Electric Force Microscopy

Thierry Mélin, H. Diesinger, D. Deresmes et al. · Physical Review Letters · 2004 · 59 citations

Engineering, Physics, Microscopy +13

Charge injection in individual silicon nanoparticles deposited on a conductive substrate

Thierry Mélin, D. Deresmes, Didier Stiévenard · Applied Physics Letters · 2002 · 58 citations

Electric Force Microscopy, Engineering, Silicon On Insulator +17

Charging and discharging processes of carbon nanotubes probed by electrostatic force microscopy

Mariusz Zdrojek, Thierry Mélin, H. Diesinger et al. · Journal of Applied Physics · 2006 · 55 citations

Electric Force Microscopy, Engineering, Glow Discharge +18

Numerical simulations for a quantitative analysis of AFM electrostatic nanopatterning on PMMA by Kelvin force microscopy

Étienne Palleau, Laurence Ressier, Łukasz Borowik et al. · Nanotechnology · 2010 · 53 citations