R. J. Koestner - Concepedia

Concepedia

Author

R. J. Koestner

Texas Instruments (United States)

Also Known As

R. J. Koestner, R. Koestner, R.J. Koestner, Roland J. Koestner, Roland John Koestner, Roland Koestner

35

Publications

1.2K

Citations

15

H-Index

46

Concepts

All Affiliations

Texas Instruments (United States)General Motors (United States)Clarkson University University of North Texas United States Naval Research Laboratory

RJ

About

R. J. Koestner is an author at Texas Instruments (United States) specializing in engineering, applied physics, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	14	16	512
2	Applied Physics	11	12	413
3	Chemical Engineering	5	5	203
4	Chemistry	5	5	208
5	Natural Sciences	2	2	39

R. J. Koestner

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18

Publications

1.2K

Citations

15

H-Index

	Year	Citations
Boosting Fuel Cell Performance with Accessible Carbon Mesopores Venkata Yarlagadda, Michael K. Carpenter, Thomas E. Moylan, ACS Energy Letters	2018	635
Kinetics of molecular‐beam epitaxial HgCdTe growth R. J. Koestner, H. F. Schaake Journal of Vacuum Science & Technology A Vacuum Surfaces and Films SemiconductorsMaterials ScienceEpitaxial GrowthGrowth OrientationsEngineering	1988	84
Imaging and Microanalysis of Thin Ionomer Layers by Scanning Transmission Electron Microscopy David A. Cullen, R. J. Koestner, Ratandeep S. Kukreja, Journal of The Electrochemical Society EngineeringTransmission Electron MicroscopyMicroscopyThin Ionomer LayersChemistry	2014	68
Editors’ Choice—Ionomer Side Chain Length and Equivalent Weight Impact on High Current Density Transport Resistances in PEMFC Cathodes Nagappan Ramaswamy, Swami Kumaraguru, R. J. Koestner, Journal of The Electrochemical Society Pfsa IonomersElectrical EngineeringChemical EngineeringEngineeringTransport Resistances	2021	55
Characterization of molecular‐beam epitaxially grown HgTe films by Shubnikov–de Haas measurements R. J. Justice, David G. Seiler, W. Zawadzki, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films EngineeringShubnikov–de Haas MeasurementsSemiconductor NanostructuresSemiconductorsIi-vi Semiconductor	1988	53
AFM Imaging of Adsorbed Nafion Polymer on Mica and Graphite at Molecular Level R. J. Koestner, Yuri Roiter, Irina A. Kozhinova, Langmuir Atomic Force MicroscopyEngineeringMolecular LevelCoil ConformationAfm Imaging	2011	43
Resonant tunneling through a HgTe/Hg1−<i>x</i>Cd<i>x</i>Te double barrier, single quantum well heterostructure Mark A. Reed, R. J. Koestner, M. W. Goodwin Applied Physics Letters	1986	39
Shubnikov–de Haas measurements on <i>n</i>- and <i>p</i>-type HgTe-CdTe superlattices David G. Seiler, G. B. Ward, R. J. Justice, Journal of Applied Physics SemiconductorsSuperconducting MaterialIi-vi SemiconductorHigh-tc SuperconductivityEngineering	1989	38
Effect of Local Charge Distribution on Graphite Surface on Nafion Polymer Adsorption as Visualized at the Molecular Level R. J. Koestner, Yuri Roiter, Irina A. Kozhinova, The Journal of Physical Chemistry C In-situ AfmEngineeringElectrode-electrolyte InterfaceMolecular LevelChemistry	2011	23
Improved structural quality of molecular-beam epitaxy HgCdTe films R. J. Koestner, H.-Y. Liu, H. F. Schaake, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films Materials ScienceSemiconductorsIi-vi SemiconductorEngineeringDislocation Interaction	1989	22

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