Chiou-Feng Chen

The dielectric reliability of intrinsic thin SiO₂films thermally grown on a heavily doped Si substrate—characterization and modeling

Chiou-Feng Chen, Ching-Yuan Wu, Ming‐Kwang Lee et al. · IEEE Transactions on Electron Devices · 1987 · 67 citations

Engineering, Electrical Engineering, Materials Science +17

A characterization model for ramp-voltage-stressed I-V characteristics of thin thermal oxides grown on silicon substrate

Chiou-Feng Chen, Ching-Yuan Wu · Solid-State Electronics · 1986 · 32 citations

Engineering, Electrical Engineering, Materials Science +13

A characterization model for constant current stressed voltage-time characteristics of thin thermal oxides grown on silicon substrates

Chiou-Feng Chen, Ching-Yuan Wu · Journal of Applied Physics · 1986 · 23 citations

Engineering, Electrical Engineering, Materials Science +17

Physical model for characterizing and simulating a FLOTOX EEPROM device

Ching‐Yuan Wu, Chiou-Feng Chen · Solid-State Electronics · 1992 · 13 citations

Engineering, Computer Engineering, Electrical Engineering +12

Transport properties of thermal oxide films grown on polycrystalline silicon—Modeling and experiments

Ching‐Yuan Wu, Chiou-Feng Chen · IEEE Transactions on Electron Devices · 1987 · 10 citations

Engineering, Electrical Engineering, Materials Science +16