Renan Bouis

The Characterization and Optimization of GaN Cap Layers and SiN Cap Layers on AlGaN/GaN HEMT Structures Grown on 200 mm GaN on Silicon

Matthew Charles, Yannick Baines, Renan Bouis et al. · physica status solidi (b) · 2018 · 32 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

3-layer Fine Pitch Cu-Cu Hybrid Bonding Demonstrator With High Density TSV For Advanced CMOS Image Sensor Applications

Stéphane Nicolas, Jerzy-Javier Suarez-Berru, N. Bresson et al. · 2024 · 15 citations

Engineering, Materials Engineering, Materials Science +17

Developments in understanding the nucleation of AlN on silicon by MOCVD and its effects on defects

Matthew Charles, Alexis Bavard, Renan Bouis et al. · physica status solidi (a) · 2016 · 10 citations

Engineering, Materials Engineering, Materials Science +17