Md. Mamunur Rahman

Characterization of Al Incorporation into HfO2 Dielectric by Atomic Layer Deposition

Md. Mamunur Rahman, Jun-Gyu Kim, Dae-Hyun Kim et al. · Micromachines · 2019 · 63 citations · Full text

Border Trap Extraction with Capacitance- Equivalent Thickness to Reflect the Quantum Mechanical Effect on Atomic Layer Deposition High-k/In0.53Ga0.47As on 300-mm Si Substrate

Md. Mamunur Rahman, Jun-Gyu Kim, Dae-Hyun Kim et al. · Scientific Reports · 2019 · 22 citations · Full text

Characterization of Electrical Traps Formed in Al2O3 under Various ALD Conditions

Md. Mamunur Rahman, Ki‐Yong Shin, Tae‐Woo Kim · Materials · 2020 · 16 citations · Full text

Wheel therapy chair: A smart system for disabled person with therapy facility

Md. Mamunur Rahman, Swarup Chakraborty, Avradip Paul et al. · 2017 · 11 citations

Border Trap Characterizations of Al2O3/ZrO2 and Al2O3/HfO2 Bilayer Films Based on Ambient Post Metal Annealing and Constant Voltage Stress

Md. Mamunur Rahman, Dae-Hyun Kim, Tae‐Woo Kim · Nanomaterials · 2020 · 11 citations · Full text