Concepedia
Statistics
Publications
7
Citations
170
H-Index
Active since
1984
Affiliations
RCA (United States)(Current)
Princeton University
R. Soydan is an author at RCA (United States) specializing in engineering, applied physics, and microelectronics.
Top concepts
EngineeringApplied PhysicsMaterial ScienceMicroelectronicsElectrical EngineeringDefect ToleranceMaterials EngineeringMicrostructureMicrofabricationCrystalline Defects
Publications per year
1984–1990
Uniformly Thick Selective Epitaxial Silicon
R. Pagliaro, J. F. Corboy, L. Jastrzȩbski et al. · Journal of The Electrochemical Society · 1987 · 35 citations
Materials Engineering, Electrical Engineering, Wafer Scale Processing +12
Issues and Problems Involved in Selective Epitaxial Growth of Silicon for SOI Fabrication
L. Jastrzȩbski, J. F. Corboy, R. Soydan · Journal of The Electrochemical Society · 1989 · 33 citations
Selective Epitaxial Growth, Engineering, Silicon On Insulator +16
A Comparison of Internal Gettering during Bipolar, CMOS, and CCD (High, Medium, Low Temperature) Processes
L. Jastrzȩbski, R. Soydan, J. T. McGinn et al. · Journal of The Electrochemical Society · 1987 · 32 citations
Engineering, Defect Tolerance, Low Temperature +16
The Effect of Nitrogen on the Mechanical Properties of Float Zone Silicon and on CCD Device Performance
L. Jastrzȩbski, G. W. Cullen, R. Soydan et al. · Journal of The Electrochemical Society · 1987 · 19 citations
Materials Science, Engineering, Ccd Device Performance +14
The Effect of Heavy Metal Contamination on Defects in CCD Imagers: Contamination Monitoring by Surface Photovoltage
L. Jastrzȩbski, R. Soydan, H. Elabd et al. · Journal of The Electrochemical Society · 1990 · 19 citations
Engineering, Defect Tolerance, Photovoltaics +16
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