M. Petraşcu

A method for analysis and profiling of boron, carbon and oxygen impurities in semiconductor wafers by recoil atoms in heavy ion beams

M. Petraşcu, I. Berceanu, I.M. Brâncuş et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 1984 · 52 citations

Ion Implantation, Engineering, Physics +7

Evidence for Intermediate Structure Near an Isobaric Analog Resonance

G. M. Temmer, Michio Maruyama, D.W. Mingay et al. · Physical Review Letters · 1971 · 34 citations

Analog Resonance, 2.22-Mev Excitation, Engineering +14

Synthesis of tungsten carbide thin films by reactive pulsed laser deposition

N. Chiţică, E. M. Gyorgy, Adriana E. Lita et al. · Thin Solid Films · 1997 · 24 citations

Materials Engineering, Materials Science, Advanced Laser Processing +7

Enhancement of<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>γ</mml:mi></mml:math>-Ray Absorption in the Radiation Field of a High-Power Laser

C. B. Collins, Silviu Olariu, M. Petraşcu et al. · Physical Review Letters · 1979 · 23 citations

Engineering, Nuclear Physics, Laser Science +19

Fission by a radiationless transition in the μ mesonic atom 239Pu

V. Cojocaru, L. Marinescu, M. Petraşcu et al. · Physics Letters · 1966 · 18 citations

Radiationless Transition, Experimental Nuclear Physics, Nuclear Physics +12