D.G. Saab

CRIS: a test cultivation program for sequential VLSI circuits

D.G. Saab, Youssef Saab, Jacob A. Abraham · International Conference on Computer Aided Design · 1992 · 132 citations

Engineering, Vlsi Design, Computer Architecture +18

VLSI logic and fault simulation on general-purpose parallel computers

R.B. Mueller-Thuns, D.G. Saab, Robert Damiano et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1993 · 69 citations

Engineering, Vlsi Design, Hardware Verification Language +24

Structural and behavioral synthesis for testability techniques

Chung-Hsing Chen, Tanay Karnik, D.G. Saab · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1994 · 60 citations

Engineering, Verification, Computer Architecture +23

Application of simple genetic algorithms to sequential circuit test generation

E.M. Rudnick, John G. Holm, D.G. Saab et al. · 2002 · 60 citations

Population Size, Mutation-based Testing, Engineering +14

CHEETA: Composition of hierarchical sequential tests using ATKET

P. Vishakantaiah, Jacob A. Abraham, D.G. Saab · 2002 · 49 citations

Engineering, Verification, Test Data Generation +19