D. Gerth

The effect of grain orientation on the relaxation of thermomechanical stress and hillock growth in AI-1%Si conductor layers on silicon substrates

R. A. Schwarzer, D. Gerth · Journal of Electronic Materials · 1993 · 50 citations

Materials Engineering, Materials Science, Hillock Growth +14

Study of the thermal behaviour of thin aluminium alloy films

D. Gerth, D. S. Katzer, M. A. Krohn · Thin Solid Films · 1992 · 42 citations

Materials Science, Materials Engineering, Aluminium Nitride +11

Graphical Representation of Grain and Hillock Orientations inAnnealed Al–1%Si Films

D. Gerth, R. A. Schwarzer · Texture Stress and Microstructure · 1993 · 25 citations · Full text

Correlation between Grain Growth and Hillock Growth in Thin Thermally Annealed Al-1%Si Films on Silicon Substrates

D. Gerth, D. S. Katzer, R. A. Schwarzer · Materials science forum · 1992 · 16 citations

Materials Science, Hillock Growth, Epitaxial Growth +11

Interlaminar crack growth in third-generation thermoset prepreg systems

Volker Altstädt, D. Gerth, Michael Stängle et al. · Polymer · 1993 · 15 citations

Materials Engineering, Materials Science, Engineering +7