Eiichi Mizuta

Investigation of Single-Event Damages on Silicon Carbide (SiC) Power MOSFETs

Eiichi Mizuta, S. Kuboyama, Hiroshi Abe et al. · IEEE Transactions on Nuclear Science · 2014 · 157 citations · Full text

Engineering, Electrical Engineering, Power Electronics +16

Single-Event Damage Observed in GaN-on-Si HEMTs for Power Control Applications

Eiichi Mizuta, S. Kuboyama, Yuki Nakada et al. · IEEE Transactions on Nuclear Science · 2018 · 81 citations · Full text

Engineering, Electrical Engineering, Materials Engineering +17

OBSERVATION OF DIFFUSE COSMIC AND ATMOSPHERIC GAMMA RAYS AT BALLOON ALTITUDES WITH AN ELECTRON-TRACKING COMPTON CAMERA

Atsushi Takada, H. Kubo, H. Nishimura et al. · The Astrophysical Journal · 2011 · 62 citations · Full text

Natural Sciences, Astronomy, Physics +17

Thermal Runaway in SiC Schottky Barrier Diodes Caused by Heavy Ions

S. Kuboyama, Eiichi Mizuta, Yuki Nakada et al. · IEEE Transactions on Nuclear Science · 2019 · 32 citations

Engineering, Electrical Engineering, Materials Science +17

Physical Analysis of Damage Sites Introduced by SEGR in Silicon Vertical Power MOSFETs and Implications for Postirradiation Gate-Stress Test

S. Kuboyama, Eiichi Mizuta, Yuki Nakada et al. · IEEE Transactions on Nuclear Science · 2019 · 22 citations · Full text

Engineering, Electrical Engineering, Microelectronics +16