Chong-Rong Huang

Improved Gate Reliability Normally-Off p-GaN/AlN/AlGaN/GaN HEMT With AlGaN Cap-Layer

Chia‐Hao Liu, Hsien‐Chin Chiu, Hsiang-Chun Wang et al. · IEEE Electron Device Letters · 2021 · 56 citations

Engineering, Electrical Engineering, Materials Science +17

Normally-off p-GaN Gated AlGaN/GaN HEMTs Using Plasma Oxidation Technique in Access Region

Xinke Liu, Hsien‐Chin Chiu, Chia‐Hao Liu et al. · IEEE Journal of the Electron Devices Society · 2020 · 36 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Normally-Off p-GaN Gated AlGaN/GaN MIS-HEMTs with ALD-Grown Al2O3/AlN Composite Gate Insulator

Hsien‐Chin Chiu, Chia‐Hao Liu, Chong-Rong Huang et al. · Membranes · 2021 · 26 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Low-Mg out-diffusion of a normally off p-GaN gate high-electron-mobility transistor by using the laser activation technique

Hsien‐Chin Chiu, Chia‐Hao Liu, Hsuan‐Ling Kao et al. · Materials Science in Semiconductor Processing · 2020 · 11 citations

Engineering, Electrical Engineering, Materials Science +16

Characteristic Analysis of AlGaN/GaN HEMT with Composited Buffer Layer on High-Heat Dissipation Poly-AlN Substrates

Chong-Rong Huang, Hsien‐Chin Chiu, Chia‐Hao Liu et al. · Membranes · 2021 · 10 citations · Full text

Engineering, Electrical Engineering, Materials Science +17