H.S. von Harrach

Enhanced Detection Sensitivity with a New Windowless XEDS System for AEM Based on Silicon Drift Detector Technology

P. Schloßmacher, D. O. Klenov, Bert Freitag et al. · Microscopy Today · 2010 · 139 citations · Full text

Natural Sciences, Materials Science, Analytical Chemistry +16

Challenges to Quantitative Multivariate Statistical Analysis of Atomic-Resolution X-Ray Spectral

Paul G. Kotula, Dmitri O. Klenov, H.S. von Harrach · Microscopy and Microanalysis · 2012 · 44 citations

Natural Sciences, Chemistry, Materials Science +12

The TEM contrast of faceted voids

A.J.E. Foreman, H.S. von Harrach, D. K. Saldin · Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties · 1982 · 33 citations

Natural Sciences, Materials Science, Physics +13

Instrumental factors in high-resolution FEG STEM

H.S. von Harrach · Ultramicroscopy · 1995 · 30 citations

Natural Sciences, Materials Engineering, Materials Science +5

An integrated multiple silicon drift detector system for transmission electron microscopes

H.S. von Harrach, Pleun Dona, Bert Freitag et al. · Journal of Physics Conference Series · 2010 · 29 citations · Full text

Engineering, Electrical Engineering, Instrumentation +15