Concepedia

U. NOLD

UN

Statistics

Publications

1

Citations

22

H-Index

1

Active since

1989

Affiliations

Darmstadt University of Applied Sciences(Current)

U. NOLD is an author at Darmstadt University of Applied Sciences specializing in reliability tests, thermal properties of semiconductors, and device reliability.

Publications per year

1989–1989

1

Publications

1

Suitability of GaAs Schottky metallizations for continuous device operation at elevated temperatures up to 300°C: a comparative study

Joachim Würfl, Brandon Merkl, U. NOLD · International Journal of Electronics · 1989 · 22 citations

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