Hideyuki Uehigashi

Transmission electron microscope study of a threading dislocation with and its effect on leakage in a 4H–SiC MOSFET

Shoichi Onda, H. Watanabe, Yasuo Kito et al. · Philosophical Magazine Letters · 2013 · 41 citations

Temperature dependence of photocapacitance spectrum of CIGS thin-film solar cell

T. Sakurai, Hideyuki Uehigashi, Muhammad Monirul Islam et al. · Thin Solid Films · 2008 · 35 citations

Materials Science, Electrical Engineering, Engineering +8

Dependence of Se beam pressure on defect states in CIGS-based solar cells

T. Sakurai, Muhammad Monirul Islam, Hideyuki Uehigashi et al. · Solar Energy Materials and Solar Cells · 2010 · 35 citations

Ii-vi Semiconductor, Electrical Engineering, Se Beam Pressure +9

Threading dislocation with b=c+2a in 4H-SiC as determined by LACBED

Shoichi Onda, H. Watanabe, Takeshi Okamoto et al. · Philosophical Magazine Letters · 2015 · 16 citations

Materials Science, Materials Engineering, Engineering +13

Analysis and Reduction of Stacking Faults in Fast Epitaxial Growth

Hideyuki Uehigashi, Keisuke Fukada, Masahiko Ito et al. · Materials science forum · 2016 · 15 citations

Materials Engineering, Electrical Engineering, Epitaxial Growth +11