Statistics
Publications
1
Citations
23
H-Index
1
Active since
2001
Affiliations
Siemens (Germany)(Current)
V. Klüppel is an author at Siemens (Germany) specializing in focused ion beam scanning electron microscopy, materials science, and radiation damage simulation.
Publications per year
2001–2001
1
1
W. Boxleitner, G. Hobler, V. Klüppel et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2001 · 23 citations
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