M. Richter

Surface extended-x-ray-absorption fine structure and scanning tunneling microscopy of Si(001)2×1-Sb

M. Richter, J. C. Woicik, J. Nogami et al. · Physical Review Letters · 1990 · 137 citations

Materials Science, Surface Characterization, Engineering +13

In situ scanning tunneling microscopy studies of the underpotential deposition of lead on gold (111)

M. P. Green, K. J. Hanson, Daniel A. Scherson et al. · The Journal of Physical Chemistry · 1989 · 72 citations

Engineering, Altmetric Attention Score, Lead Identification +18

H plasma cleaning and a-Si passivation of GaAs for surface channel device applications

Chiara Marchiori, D. J. Webb, C. Rossel et al. · Journal of Applied Physics · 2009 · 52 citations

Semiconductors, Semiconductor Technology, Electrical Engineering +14

An integration path for gate-first UTB III-V-on-insulator MOSFETs with silicon, using direct wafer bonding and donor wafer recycling

Lukas Czornomaz, N. Daix, Daniele Caimi et al. · 2012 · 46 citations

Wide-bandgap Semiconductor, Integration Path, Engineering +20

Preparation of electron waveguide devices on GaAs/AlGaAs using negative-tone resist calixarene

Michael Knop, M. Richter, R Maßmann et al. · Semiconductor Science and Technology · 2005 · 37 citations

Aluminium Nitride, Categoryquantum Electronics, Engineering +19