Dae Woong Kwon

Light Effect on Negative Bias-Induced Instability of HfInZnO Amorphous Oxide Thin-Film Transistor

Dae Woong Kwon, Jang Hyun Kim, Ji Soo Chang et al. · IEEE Transactions on Electron Devices · 2011 · 31 citations

Ss Degradation, Engineering, Optoelectronic Devices +18

Effects of Localized Body Doping on Switching Characteristics of Tunnel FET Inverters With Vertical Structures

Dae Woong Kwon, Hyunwoo Kim, Jang Hyun Kim et al. · IEEE Transactions on Electron Devices · 2017 · 28 citations

Device Modeling, Electrical Engineering, Localized Body +13

Temperature effect on negative bias-induced instability of HfInZnO amorphous oxide thin film transistor

Dae Woong Kwon, Jang Hyun Kim, Ji Soo Chang et al. · Applied Physics Letters · 2011 · 20 citations

Semiconductors, Semiconductor Technology, Electrical Engineering +14

Investigation of Feasibility of Tunneling Field Effect Transistor (TFET) as Highly Sensitive and Multi-sensing Biosensors

Ryoongbin Lee, Dae Woong Kwon, Sihyun Kim et al. · JSTS Journal of Semiconductor Technology and Science · 2017 · 17 citations

Electrical Engineering, Highly Sensitive, Engineering +15

Investigation on the characteristics of stress-induced hump in amorphous oxide thin film transistors

Jang Hyun Kim, Dae Woong Kwon, Ji Soo Chang et al. · Applied Physics Letters · 2011 · 16 citations

Materials Science, Electrical Engineering, Thin Film Transistors +15