A. B. Bollong

A comparison of techniques for nondestructive composition measurements in CdZnTe substrates

S. P. Tobin, J. Tower, P. W. Norton et al. · Journal of Electronic Materials · 1995 · 62 citations

Materials Science, Materials Engineering, Electrical Engineering +9

CdZnTe substrate impurities and their effects on liquid phase epitaxy HgCdTe

J. Tower, S. P. Tobin, M. Kestigian et al. · Journal of Electronic Materials · 1995 · 37 citations

Ii-vi Semiconductor, Applied Physics, Cdznte Substrate Impurities +5

Trace copper measurements and electrical effects in LPE HgCdTe

J. Tower, S. P. Tobin, P. W. Norton et al. · Journal of Electronic Materials · 1996 · 18 citations

Electrical Engineering, Lpe Hgcdte, Engineering +2

Cadmium zinc telluride substrate growth, characterization, and evaluation

M. Kestigian, A. B. Bollong, Jeffrey J. Derby et al. · Journal of Electronic Materials · 1999 · 12 citations

Materials Engineering, Materials Science, Engineering +3

Impurity study of CdZnTe substrates used for LPE HgCdTe

A. B. Bollong, G. Feldewerth, J. Tower et al. · Advanced Materials for Optics and Electronics · 1995 · 11 citations

Materials Science, Ii-vi Semiconductor, Electrical Engineering +15