Samuel Nash

Characterization of GaAs devices by a versatile pulsed I-V measurement system

A. Platzker, A. Palevsky, Samuel Nash et al. · 2002 · 80 citations

Engineering, I-v Measurement System, Dc Bias +18

Distributed small signal model for multi-fingered GaAs PHEMT/MESFET devices

Samuel Nash, A. Platzker, W. Struble · 2002 · 22 citations

Device Modeling, Electrical Engineering, Engineering +12

First two operational years of the electron-beam ion trap charge breeder at the National Superconducting Cyclotron Laboratory

A. Lapierre, G. Bollen, Dan Crisp et al. · Physical Review Accelerators and Beams · 2018 · 21 citations · Full text

Engineering, Nuclear Physics, Ion Beam Instrumentation +19

A new small signal MESFET and HEMT model compatible with large signal modeling

W. Struble, A. Platzker, Samuel Nash et al. · 2002 · 14 citations

Device Modeling, Low-power Electronics, Electrical Engineering +12

Monolithic Ka-band VCOs

R.E. Goldwasser, Dan Donoghue, G. Dawe et al. · 2003 · 13 citations

Electrical Engineering, Engineering, Rf Semiconductor +15