Nancy L. Michael

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Active since

2001

Affiliations

The University of Texas at Arlington(Current)

Nancy L. Michael is an author at The University of Texas at Arlington specializing in electromigration, interconnect reliability, and semiconductor reliability.

Publications per year

2001–2003

Publications

Electromigration failure in ultra-fine copper interconnects

Nancy L. Michael, Choong-Un Kim, Paul Gillespie et al. · Journal of Electronic Materials · 2003 · 23 citations

Engineering, Electrical Engineering, Materials Engineering +14

Mechanism of electromigration failure in submicron Cu interconnects

Nancy L. Michael, Choong-Un Kim, Qing-Tang Jiang et al. · Journal of Electronic Materials · 2002 · 22 citations

Engineering, Electrical Engineering, Materials Science +14

Electromigration in Cu thin films with Sn and Al cross strips

Nancy L. Michael, Choong-Un Kim · Journal of Applied Physics · 2001 · 21 citations

Natural Sciences, Materials Engineering, Materials Science +11

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