S. M. Rooks is an author at University of Toronto specializing in x-ray imaging, instrumentation, and engineering.
Top concepts
EngineeringX-ray ImagingInstrumentationMicroscopy3D IntegrationHardware SystemsMicroelectronicsMicrofabricationAdvanced PackagingIntegrated Circuits
Publications per year
1995–1995
2
2
S. M. Rooks, B. Benhabib, K.C. Smith · IEEE Transactions on Components Packaging and Manufacturing Technology Part A · 1995 · 58 citations
X‐ray Inspection of Flip Chip Attach Using Digital Tomosynthesis
S. M. Rooks, T. C. Sack · Circuit World · 1995 · 18 citations
Rows per page
1–2 of 2