J. Heckel

A compact μ-XRF spectrometer for (in situ) analyses of cultural heritage and forensic materials

G. Vittiglio, Stefan Bichlmeier, Paul D. Klinger et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2003 · 50 citations

X-ray Spectroscopy, Material Culture, Compact μ-Xrf Spectrometer +8

Component selection for a compact micro‐XRF spectrometer

Stefan Bichlmeier, Koen Janssens, J. Heckel et al. · X-Ray Spectrometry · 2001 · 41 citations · Full text

Engineering, X-ray Spectroscopy, Component Selection +23

Fast analysis of traces and major elements with ED(P)XRF using polarized X-rays: TURBOQUANT

R. Schramm, J. Heckel · Journal de Physique IV (Proceedings) · 1998 · 31 citations

Multi‐element trace analysis of rocks and soils by EDXRF using polarized radiation

J. Heckel, M. Brumme, Andrew Weinert et al. · X-Ray Spectrometry · 1991 · 27 citations

X-ray Spectroscopy, Engineering, Trace Element Geochemistry +21

Principles and applications of energy-dispersive X-ray fluorescence analysis with polarized radiation

J. Heckel, Michael Haschke, M. Brumme et al. · Journal of Analytical Atomic Spectrometry · 1992 · 23 citations

Xrf Technique, X-ray Spectroscopy, Environmental Monitoring +17